Thermal-aware Test Schedule and TAM Co-Optimization for Three Dimensional IC

Journal

Active and Passive Electronic Components

Journal Volume

2012

Date Issued

2012-01

Author(s)

C. J. Shih

C. Y. Hsu

C. Y. Kou

J. C. M. Li

J. C. Rau

K. Chakrabarty

DOI

10.1155/2012/763572

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/374344

Type

journal article