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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk,
Details
Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk,
Journal
ITC
Date Issued
2012-01
Author(s)
CHIEN-MO LI
M. H. Tsai
W. S. Ting
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/374347
Type
conference paper