Systematic Open Via Diagnosis Based on Physical Features

Journal

IEEE Silicon Debug and Diagnosis Workshop

Date Issued

2012-01

Author(s)

P. J. Chen

C. C. Che

J. C. M. Li

K. Y. Tsai

S. F. Kuo

P. Y. Hsueh

Y. Y. Chen

J. N. Lee

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/374351

Type

conference paper