Studying the short channel effect in the scaling of the AlGaN/GaN nanowire transistors

Please use this identifier to cite or link to this item: https://scholars.lib.ntu.edu.tw/handle/123456789/377754

Title:	Studying the short channel effect in the scaling of the AlGaN/GaN nanowire transistors
Authors:	Chen, Chin-Yi Wu, Yuh-Renn YUH-RENN WU
Issue Date:	2013
Journal Volume:	113
Journal Issue:	21
Source:	Journal of Applied Physics
URI:	http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000320674500082&KeyUID=WOS:000320674500082 http://scholars.lib.ntu.edu.tw/handle/123456789/377754
DOI:	10.1063/1.4808241
Appears in Collections:	光電工程學研究所

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