https://scholars.lib.ntu.edu.tw/handle/123456789/377754| Title: | Studying the short channel effect in the scaling of the AlGaN/GaN nanowire transistors | Authors: | YUH-RENN WU | Issue Date: | 2013 | Journal Volume: | 113 | Journal Issue: | 21 | Source: | Journal of Applied Physics | URI: | http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000320674500082&KeyUID=WOS:000320674500082 http://scholars.lib.ntu.edu.tw/handle/123456789/377754 |
DOI: | 10.1063/1.4808241 |
| Appears in Collections: | 光電工程學研究所 |
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