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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Microwave determination of quantum-well capture and escape time in light-emitting transistors
Details
Microwave determination of quantum-well capture and escape time in light-emitting transistors
Journal
IEEE Transactions on Electron Devices
Journal Volume
60
Journal Issue
3
Pages
1088-1091
Date Issued
2013
Author(s)
CHAO-HSIN WU
Wang, H.-L.
Chou, P.-H.
CHAO-HSIN WU
DOI
10.1109/TED.2013.2242330
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84874649957&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/377820
Type
journal article