https://scholars.lib.ntu.edu.tw/handle/123456789/378068| Title: | Sensitivity enhancement of metal-oxide-semiconductor tunneling photodiode with trapped electrons in ultra-thin SiO2 layer | Authors: | Chen, T.-Y. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2013 | Journal Volume: | 58 | Journal Issue: | 8 | Start page/Pages: | 79-85 | Source: | ECS Transactions | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84904917657&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/378068 |
DOI: | 10.1149/05808.0079ecst |
| Appears in Collections: | 電機工程學系 |
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