https://scholars.lib.ntu.edu.tw/handle/123456789/378073
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Tseng, P.-H. | en_US |
dc.contributor.author | Hwu, J.-G. | en_US |
dc.contributor.author | JENN-GWO HWU | zz |
dc.creator | Tseng, P.-H.;Hwu, J.-G. | - |
dc.date.accessioned | 2018-09-10T09:44:19Z | - |
dc.date.available | 2018-09-10T09:44:19Z | - |
dc.date.issued | 2013 | - |
dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-84885623869&partnerID=MN8TOARS | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/378073 | - |
dc.language | en | en |
dc.relation.ispartof | ECS Transactions | - |
dc.source | AH | - |
dc.title | Interface trap redistribution and deep depletion behavior of non-planar MOS with ultra thin oxide grown by anodic oxidation | - |
dc.type | conference paper | en |
dc.identifier.doi | 10.1149/05301.0331ecst | - |
dc.relation.pages | 331-341 | - |
dc.relation.journalvolume | 53 | - |
dc.relation.journalissue | 1 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.openairetype | conference paper | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 電機工程學系 |
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