Characterization of single-crystalline aluminum thin film on (100) GaAs substrate

Journal

Japanese Journal of Applied Physics

Journal Volume

52

Journal Issue

4 PART 1

Date Issued

2013

Author(s)

DOI

10.7567/JJAP.52.045801

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-84880825531&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/378923

Type

journal article