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College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Absorptive thin film characterization with spectroscopic full-field optical coherence tomography
Details
Absorptive thin film characterization with spectroscopic full-field optical coherence tomography
Journal
CLEO: Science and Innovations, CLEO_SI 2013
Date Issued
2013
Author(s)
Huang, S.-L.
Ho, T.-S.
Tsai, C.-C.
Hsu, K.-Y.
SHENG-LUNG HUANG
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84887462806&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/379925
Type
conference paper