https://scholars.lib.ntu.edu.tw/handle/123456789/380227
標題: | Manganese K- and L3-edge X-ray absorption fine structure study of Zn1-xMnxTe | 作者: | Zheng, W. Jang, L.-Y. Lee, J.-M. Zheng, R.S. CHEE-WEE LIU Becla, P. Feng, Z.C. |
關鍵字: | Extended X-ray absorption fine structure; X-ray absorption fine structure; X-ray absorption near-edge structure; ZnMnTe | 公開日期: | 2013 | 卷: | 634-638 | 期: | 1 | 起(迄)頁: | 2489-2492 | 來源出版物: | Advanced Materials Research | 摘要: | High-resolution synchrotron radiation x-ray absorption data on Mn K- and L3-edge for semimagnetic semiconductor Zn1-xMnxTe bulk materials are presented. A detailed analysis of the extended x-ray absorption fine structure by using the IFEFFIT program, and the chemical bonds of Mn-Te are obtained. The x-ray absorption near-edge structure of the Mn K- and L3-edges are investigated, and the electronic structure of Zn1-xMnxTe with various compositions are studied. © (2013) Trans Tech Publications, Switzerland. |
URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84873278189&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/380227 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84873278189&doi=10.4028%2fwww.scientific.net%2fAMR.634-638.2489&partnerID=40&md5=9f9624a320ea3ad2371019b914c683af |
ISSN: | 10226680 | DOI: | 10.4028/www.scientific.net/AMR.634-638.2489 | SDG/關鍵字: | Bulk materials; Extended X-ray absorption fine structures; High resolution; IFEFFIT; Semimagnetic semiconductor; X ray absorption fine structures; X-ray absorption near-edge structure; ZnMnTe; Absorption spectra; Chemical bonds; Electronic structure; Extended X ray absorption fine structure spectroscopy; Metallurgical engineering; Semiconducting tellurium; X ray absorption; Zinc; Manganese |
顯示於: | 電機工程學系 |
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