Manganese K- and L3-edge X-ray absorption fine structure study of Zn1-xMnxTe
Journal
Advanced Materials Research
Journal Volume
634-638
Journal Issue
1
Pages
2489-2492
Date Issued
2013
Author(s)
URI
Abstract
High-resolution synchrotron radiation x-ray absorption data on Mn K- and L3-edge for semimagnetic semiconductor Zn1-xMnxTe bulk materials are presented. A detailed analysis of the extended x-ray absorption fine structure by using the IFEFFIT program, and the chemical bonds of Mn-Te are obtained. The x-ray absorption near-edge structure of the Mn K- and L3-edges are investigated, and the electronic structure of Zn1-xMnxTe with various compositions are studied. © (2013) Trans Tech Publications, Switzerland.
Subjects
Extended X-ray absorption fine structure; X-ray absorption fine structure; X-ray absorption near-edge structure; ZnMnTe
Other Subjects
Bulk materials; Extended X-ray absorption fine structures; High resolution; IFEFFIT; Semimagnetic semiconductor; X ray absorption fine structures; X-ray absorption near-edge structure; ZnMnTe; Absorption spectra; Chemical bonds; Electronic structure; Extended X ray absorption fine structure spectroscopy; Metallurgical engineering; Semiconducting tellurium; X ray absorption; Zinc; Manganese
Type
conference paper