https://scholars.lib.ntu.edu.tw/handle/123456789/381717
Title: | Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM | Authors: | BC Bai C-L Hsu MH Wu CA Chen YW Chen KL Luo LC Cheng JCM Li CHIEN-MO LI |
Issue Date: | Jan-2013 | Source: | IEEE Asian Test Symposium | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/381717 | DOI: | 10.1109/ATS.2013.32 |
Appears in Collections: | 電子工程學研究所 |
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