Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Test Generation of Path Delay Faults Induced by Defects in Power TSV
Details
Test Generation of Path Delay Faults Induced by Defects in Power TSV
Journal
IEEE Asian Test Symposium
Date Issued
2013-01
Author(s)
CHIEN-MO LI
Chi-Jih Shih
Shih-An Hsieh
Yi-Chang Lu
James Chien-Mo Li
Tzong-Lin Wu
K. Chakrabarty
CHIEN-MO LI
DOI
10.1109/ATS.2013.18
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/381718
Type
conference paper