https://scholars.lib.ntu.edu.tw/handle/123456789/381732| Title: | Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions | Authors: | Shin-Yann Ho Shuo-Ren Lin Ko-Lung Yuan Chien-Yen Kuo Kuan-Yu Liao Jie-Hong R. Jiang Chien-Mo James Li JIE-HONG JIANG |
Issue Date: | Nov-2013 | Start page/Pages: | 91-98 | Source: | IEEE/ACM International Conference on Computer-Aided Design (ICCAD) | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/381732 |
| Appears in Collections: | 電子工程學研究所 |
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