Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions
Journal
IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
Pages
91-98
Date Issued
2013-11
Author(s)
Shin-Yann Ho
Shuo-Ren Lin
Ko-Lung Yuan
Chien-Yen Kuo
Kuan-Yu Liao
Jie-Hong R. Jiang
Chien-Mo James Li
Type
conference paper