https://scholars.lib.ntu.edu.tw/handle/123456789/385257
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lu, H.-W. | en_US |
dc.contributor.author | Hwu, J.-G. | en_US |
dc.contributor.author | JENN-GWO HWU | zz |
dc.creator | Lu, H.-W.;Hwu, J.-G. | - |
dc.date.accessioned | 2018-09-10T14:54:16Z | - |
dc.date.available | 2018-09-10T14:54:16Z | - |
dc.date.issued | 2014 | - |
dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-84901639242&partnerID=MN8TOARS | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/385257 | - |
dc.language | en | en |
dc.relation.ispartof | Applied Physics A: Materials Science and Processing | en_US |
dc.source | AH | - |
dc.title | Roles of interface and oxide trap density in the kinked current behavior of Al/SiO2/Si(p) structures with ultra-thin oxides | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1007/s00339-013-7873-2 | - |
dc.relation.pages | 837-842 | - |
dc.relation.journalvolume | 115 | - |
dc.relation.journalissue | 3 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 電機工程學系 |
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