https://scholars.lib.ntu.edu.tw/handle/123456789/385266| Title: | Effect of trapped electrons in ultrathin SiO2 on the two-state inversion capacitance at varied frequencies of metal-oxide-semiconductor capacitor | Authors: | Chen, T.-Y. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2014 | Journal Volume: | 116 | Journal Issue: | 4 | Start page/Pages: | 1971-1977 | Source: | Applied Physics A: Materials Science and Processing | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84906316822&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/385266 |
DOI: | 10.1007/s00339-014-8375-6 |
| Appears in Collections: | 電機工程學系 |
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