https://scholars.lib.ntu.edu.tw/handle/123456789/385267| Title: | Corner induced non-uniform electric field effect on the electrical reliability of metal-oxide-semiconductor devices with non-planar substrates | Authors: | Tseng, P.-H. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2014 | Journal Volume: | 91 | Start page/Pages: | 100-105 | Source: | Solid-State Electronics | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84887233313&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/385267 |
DOI: | 10.1016/j.sse.2013.10.009 |
| Appears in Collections: | 電機工程學系 |
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