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Thermal manipulation utilizing micro-cantilever probe in scanning electron microscopy
Journal
Lecture Notes in Electrical Engineering
Journal Volume
306 LNEE
Pages
169-180
Date Issued
2014
Author(s)
WEN-PIN SHIH
DOI
10.1007/978-3-319-05711-8_18
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84902489084&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/385828
Type
book