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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Effect of focued ion beam imaging process on the crystallinity of InAs
Details
Effect of focued ion beam imaging process on the crystallinity of InAs
Journal
IEDMS 2014, international electron devices and materials symposium
Pages
1178
Date Issued
2014-11
Author(s)
T. H. Huang
W. C. Chen
K. C. Chen
HAO-HSIUNG LIN
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/388541
Type
conference paper