https://scholars.lib.ntu.edu.tw/handle/123456789/390934| Title: | Impact of Gate Metal on the Performance of p-GaN/AlGaN/GaN High Electron Mobility Transistors | Authors: | Lee, Finella Su, Liang-Yu Wang, Chih-Hao Wu, Yuh-Renn Huang, Jianjang JIAN-JANG HUANG YUH-RENN WU |
Issue Date: | 2015 | Journal Volume: | 36 | Journal Issue: | 3 | Start page/Pages: | 232-234 | Source: | IEEE Electron Device Letters | URI: | http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000350336100006&KeyUID=WOS:000350336100006 http://scholars.lib.ntu.edu.tw/handle/123456789/390934 |
DOI: | 10.1109/LED.2015.2395454 |
| Appears in Collections: | 光電工程學研究所 |
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