X-ray photoelectron spectroscopic investigation on Fe geometrical sites of iron nitride thin films
Journal
Japanese Journal of Applied Physics
Journal Volume
54
Pages
4
Date Issued
2015
Author(s)
Abstract
A partially ordered Fe16N2 thin film, which exhibits a higher saturation magnetization than a bcc-Fe thin film, was grown on a Au(001) texture on a GaAs(001) substrate for studies of crystalline structure, electronic structure, and magnetic properties. Fe 2p3/2 and 2p1/2 X-ray photoelectron spectroscopies (XPS) reveal the electronic hybridization between the Fe atoms and the adjacent N atoms, whereas a multipeak analysis suggests the charge-transfer-induced electronic rearrangement of electronic configuration in Fe(8h) and Fe(4e) geometrical sites. These results are consistent with the previous model and help explain the saturation magnetization enhancement in the α-FeN system. © 2015 The Japan Society of Applied Physics.
Other Subjects
Charge transfer; Crystal structure; Electronic structure; Gallium arsenide; III-V semiconductors; Iron metallography; Nitrogen compounds; Photoelectrons; Photons; Saturation magnetization; Substrates; Textures; Thin films; X rays; Crystalline structure; Electronic configuration; Electronic hybridization; Fe thin films; Fe-n systems; Iron nitride thin films; Spectroscopic investigations; X-ray photoelectrons; Iron compounds
Type
journal article