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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
TARGET: Timing-AwaRe Gate Exhaustive Transition ATPG for Cell-internal Defects
Details
TARGET: Timing-AwaRe Gate Exhaustive Transition ATPG for Cell-internal Defects
Journal
IEEE VLSI/DAT
Date Issued
2015-01
Author(s)
A.F. Lin
Kuan-Yu Liao
Kuan-Ying Chiang
CHIEN-MO LI
DOI
10.1109/VLSI-DAT.2015.7114503
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/394741
Type
conference paper
