https://scholars.lib.ntu.edu.tw/handle/123456789/394741| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | A.F. Lin | en_US |
| dc.contributor.author | Kuan-Yu Liao | en_US |
| dc.contributor.author | Kuan-Ying Chiang | en_US |
| dc.contributor.author | James Chien-Mo Li | en_US |
| dc.contributor.author | CHIEN-MO LI | zz |
| dc.creator | A.F. Lin;Kuan-Yu Liao;Kuan-Ying Chiang;James Chien-Mo Li | - |
| dc.date.accessioned | 2018-09-10T15:26:16Z | - |
| dc.date.available | 2018-09-10T15:26:16Z | - |
| dc.date.issued | 2015-01 | - |
| dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/394741 | - |
| dc.language | en | en |
| dc.relation.ispartof | IEEE VLSI/DAT | - |
| dc.source | AH-anncc | - |
| dc.title | TARGET: Timing-AwaRe Gate Exhaustive Transition ATPG for Cell-internal Defects | - |
| dc.type | conference paper | en |
| dc.identifier.doi | 10.1109/VLSI-DAT.2015.7114503 | - |
| dc.identifier.scopus | 2-s2.0-84936971876 | - |
| item.openairetype | conference paper | - |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
| item.cerifentitytype | Publications | - |
| crisitem.author.dept | Electrical Engineering | - |
| crisitem.author.dept | Electronics Engineering | - |
| crisitem.author.dept | MediaTek-NTU Research Center | - |
| crisitem.author.orcid | 0000-0002-4393-5186 | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| crisitem.author.parentorg | Others: University-Level Research Centers | - |
| Appears in Collections: | 電子工程學研究所 | |
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