Remarkably High Hole Mobility Metal-Oxide Thin-Film Transistors

Journal

Scientific Reports

Journal Volume

8

Journal Issue

1

Date Issued

2018

Author(s)

Shih, C.W.

Chin, A.

Lu, C.F.

Su, W.F.

DOI

10.1038/s41598-017-17066-x

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-85041587895&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/402173

Type

journal article