https://scholars.lib.ntu.edu.tw/handle/123456789/443330
Title: | Synchrotron radiation photoemission study of interfacial electronic structure of HfO<inf>2</inf> on In<inf>0.53</inf>Ga<inf>0.47</inf>As(001)-4 ? 2 from atomic layer deposition | Authors: | Pi, T.W. Lin, T.D. Lin, H.Y. Chang, Y.C. Wertheim, G.K. Kwo, J. Hong, M. MINGHWEI HONG |
Issue Date: | 2014 | Journal Volume: | 104 | Journal Issue: | 4 | Source: | Applied Physics Letters | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/443330 | DOI: | 10.1063/1.4863440 |
Appears in Collections: | 物理學系 |
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