https://scholars.lib.ntu.edu.tw/handle/123456789/443499
Title: | C-V and G-V characterization of in-situ fabricated Ga<inf>2</inf>O<inf>3</inf>-GaAs interfaces for inversion/accumulation device and surface passivation applications | Authors: | Passlack, M. Hong, M. Mannaerts, J.P. MINGHWEI HONG |
Issue Date: | 1996 | Journal Volume: | 39 | Journal Issue: | 8 | Start page/Pages: | 1133-1136 | Source: | Solid-State Electronics | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/443499 | DOI: | 10.1016/0038-1101(96)00006-8 |
Appears in Collections: | 物理學系 |
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