https://scholars.lib.ntu.edu.tw/handle/123456789/447967
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Liao, M.-H. | en_US |
dc.contributor.author | Chen, C.-H. | en_US |
dc.contributor.author | MING-HAN LIAO | en_US |
dc.creator | MING-HAN LIAO;Chen, C.-H.;Liao, M.-H. | - |
dc.date.accessioned | 2020-01-13T08:22:37Z | - |
dc.date.available | 2020-01-13T08:22:37Z | - |
dc.date.issued | 2013 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/447967 | - |
dc.relation.ispartof | AIP Advances | - |
dc.title | Improved Si<inf>0.5</inf>Ge<inf>0.5</inf>/Si interface quality achieved by the process of low energy hydrogen plasma cleaning and investigation of interface quality with positron annihilation spectroscopy | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.1063/1.4801933 | - |
dc.identifier.scopus | 2-s2.0-84877339340 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84877339340&doi=10.1063%2f1.4801933&partnerID=40&md5=a9498a84ed3426d841ece711e19183b2 | - |
dc.relation.journalvolume | 3 | - |
dc.relation.journalissue | 4 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.orcid | 0000-0003-2942-4520 | - |
顯示於: | 機械工程學系 |
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