https://scholars.lib.ntu.edu.tw/handle/123456789/447978
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lee, M.H. | en_US |
dc.contributor.author | Chang, S.T. | en_US |
dc.contributor.author | Weng, S.-C. | en_US |
dc.contributor.author | Liu, W.-H. | en_US |
dc.contributor.author | Chen, K.-J. | en_US |
dc.contributor.author | Ho, K.-Y. | en_US |
dc.contributor.author | Liao, M.H. | en_US |
dc.contributor.author | Huang, J.-J. | en_US |
dc.contributor.author | Hu, G.-R. | en_US |
dc.contributor.author | MING-HAN LIAO | en_US |
dc.creator | MING-HAN LIAO;Hu, G.-R.;Huang, J.-J.;Liao, M.H.;Ho, K.-Y.;Chen, K.-J.;Liu, W.-H.;Weng, S.-C.;Chang, S.T.;Lee, M.H. | - |
dc.date.accessioned | 2020-01-13T08:22:39Z | - |
dc.date.available | 2020-01-13T08:22:39Z | - |
dc.date.issued | 2009 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/447978 | - |
dc.relation.ispartof | IEEE International Reliability Physics Symposium Proceedings | - |
dc.title | The correlation between trap states and mechanical reliability of amorphous Si:H TFTS for flexible electronics | en_US |
dc.type | conference paper | en |
dc.identifier.doi | 10.1109/IRPS.2009.5173388 | - |
dc.identifier.scopus | 2-s2.0-70449130405 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-70449130405&doi=10.1109%2fIRPS.2009.5173388&partnerID=40&md5=0a654c9761dcf3d27747c33bc20ab838 | - |
dc.relation.pages | 956-959 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.openairetype | conference paper | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.orcid | 0000-0003-2942-4520 | - |
顯示於: | 機械工程學系 |
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