Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Engineering / 工學院
Industrial Engineering / 工業工程學研究所
Age-based double EWMA controller and its application to a CMP process
Details
Age-based double EWMA controller and its application to a CMP process
Journal
Run-to-Run Control in Semiconductor Manufacturing
Pages
261-276
Date Issued
2000
Author(s)
Chen, A.
Guo, R.-S.
ARGON CHEN
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/467256
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85056912945&partnerID=40&md5=7c2c22f2a70718d3cf151f4e8bead742
Type
book part