https://scholars.lib.ntu.edu.tw/handle/123456789/491209
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | YA-PING CHIU | en_US |
dc.contributor.author | Huang, B.-C. | en_US |
dc.contributor.author | Shih, M.-C. | en_US |
dc.contributor.author | Huang, P.-C. | en_US |
dc.contributor.author | CHUN-WEI CHEN | en_US |
dc.creator | CHUN-WEI CHEN;Chen, C.-W.;Huang, P.-C.;Shih, M.-C.;Huang, B.-C.;Chiu, Y.-P. | - |
dc.date.accessioned | 2020-05-12T02:49:56Z | - |
dc.date.available | 2020-05-12T02:49:56Z | - |
dc.date.issued | 2015 | - |
dc.identifier.issn | 09538984 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/491209 | - |
dc.description.abstract | Interfacial science has received much attention recently based on the development of state-of-the-art analytical tools that can create and manipulate the charge, spin, orbital, and lattice degrees of freedom at interfaces. Motivated by the importance of nanoscale interfacial science that governs device operation, we present a technique to probe the electronic characteristics of heterointerfaces with atomic resolution. In this work, the interfacial characteristics of heteroepitaxial structures are investigated and the fundamental mechanisms that pertain in these systems are elucidated through cross-sectional scanning tunneling microscopy (XSTM). The XSTM technique is employed here to directly observe epitaxial interfacial structures and probe local electronic properties with atomic-level capability. Scanning tunneling microscopy and spectroscopy experiments with atomic precision provide insight into the origin and spatial distribution of electronic properties across heterointerfaces. The first part of this report provides a brief description of the cleavage technique and spectroscopy analysis in XSTM measurements. The second part addresses interfacial electronic structures of several model heterostructures in current condensed matter research using XSTM. Topics to be discussed include high-κ's/III-V's semiconductors, polymer heterojunctions, and complex oxide heterostructures, which are all material systems whose investigation using this technique is expected to benefit the research community. Finally, practical aspects and perspectives of using XSTM in interface science are presented. © 2015 IOP Publishing Ltd. | - |
dc.relation.ispartof | Journal of Physics Condensed Matter | en_US |
dc.subject | electronic structure; heterostructures; interface; scanning tunneling spectroscopy | - |
dc.subject.other | Atoms; Condensed matter physics; Degrees of freedom (mechanics); Electronic properties; Electronic structure; Interface states; Interfaces (materials); Scanning tunneling microscopy; Cross-sectional scanning tunneling microscopies; Electronic characteristics; Fundamental mechanisms; Heteroepitaxial structure; Interfacial characteristics; Interfacial electronic structure; Scanning tunneling microscopy and spectroscopy; Scanning tunneling spectroscopy; Heterojunctions | - |
dc.title | Atomic-scale mapping of electronic structures across heterointerfaces by cross-sectional scanning tunneling microscopy | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.1088/0953-8984/27/34/343001 | - |
dc.identifier.scopus | 2-s2.0-84939644877 | - |
dc.identifier.isi | WOS:000362531800001 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84939644877&doi=10.1088%2f0953-8984%2f27%2f34%2f343001&partnerID=40&md5=40957ae594e8a5fc09a18060dd208678 | - |
dc.relation.journalvolume | 27 | - |
dc.relation.journalissue | 34 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.dept | Applied Physics | - |
crisitem.author.dept | Program in Nanoengineering and Nanoscience | - |
crisitem.author.dept | Materials Science and Engineering | - |
crisitem.author.orcid | 0000-0001-7065-4411 | - |
crisitem.author.parentorg | College of Science | - |
crisitem.author.parentorg | Graduate School of Advanced Technology | - |
crisitem.author.parentorg | College of Engineering | - |
顯示於: | 材料科學與工程學系 |
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