https://scholars.lib.ntu.edu.tw/handle/123456789/497790
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chang, K.-H. | en_US |
dc.contributor.author | Chang, C.-W. | en_US |
dc.contributor.author | Jiang, J.-H.R. | en_US |
dc.contributor.author | Liu, C.-N.J. | en_US |
dc.contributor.author | JIE-HONG JIANG | zz |
dc.creator | Chang, K.-H.;Chang, C.-W.;Jiang, J.-H.R.;Liu, C.-N.J. | - |
dc.date.accessioned | 2020-06-11T06:11:16Z | - |
dc.date.available | 2020-06-11T06:11:16Z | - |
dc.date.issued | 2012 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/497790 | - |
dc.relation.ispartof | Midwest Symposium on Circuits and Systems | - |
dc.title | Reducing test point overhead with don't-cares | en_US |
dc.type | conference paper | en |
dc.identifier.doi | 10.1109/MWSCAS.2012.6292075 | - |
dc.identifier.scopus | 2-s2.0-84867299600 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84867299600&doi=10.1109%2fMWSCAS.2012.6292075&partnerID=40&md5=23a7f0091766aa2f7bca91ccdfe540eb | - |
dc.relation.pages | 534-537 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.openairetype | conference paper | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.orcid | 0000-0002-2279-4732 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 電機工程學系 |
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