https://scholars.lib.ntu.edu.tw/handle/123456789/498012
Title: | Data retention characterization of gate-injected gold-nanoparticle non-volatile memory with low-damage CF <inf>4</inf> -plasma-treated blocking oxide layer | Authors: | Liu, Y.-H. Kao, C.-H. Cheng, T.-C. Wu, C.-I. Wang, J.-C. CHIH-I WU |
Issue Date: | 2017 | Journal Volume: | 7 | Journal Issue: | 11 | Source: | Nanomaterials | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/498012 | DOI: | 10.3390/nano7110385 |
Appears in Collections: | 電機工程學系 |
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