Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control
Journal
Chemistry of Materials
Journal Volume
29
Journal Issue
11
Pages
4700-4707
Date Issued
2017
Author(s)
Lin, W.-H.
Brar, V.W.
Jariwala, D.
Sherrott, M.C.
Tseng, W.-S.
Wu, C.-I.
Yeh, N.-C.
Atwater, H.A.
Type
journal article