https://scholars.lib.ntu.edu.tw/handle/123456789/498068
Title: | Test generation of path delay faults induced by defects in power TSV | Authors: | Shih, C.-J. Hsieh, S.-A. Lu, Y.-C. Li, J.C.-M. Wu, T.-L. TZONG-LIN WU YI-CHANG LU CHIEN-MO LI |
Issue Date: | 2013 | Start page/Pages: | 43-48 | Source: | Proceedings of the Asian Test Symposium | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/498068 | DOI: | 10.1109/ATS.2013.18 |
Appears in Collections: | 電機工程學系 |
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