https://scholars.lib.ntu.edu.tw/handle/123456789/500716| Title: | The device-perimeter dependency in the transient current of a metal-insulator-metal-insulator-semiconductor capacitor with anodic oxide films | Authors: | Liao, C.-S. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2015 | Journal Volume: | 69 | Journal Issue: | 31 | Start page/Pages: | 49-55 | Source: | ECS Transactions | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/500716 | DOI: | 10.1149/06931.0049ecst |
| Appears in Collections: | 電機工程學系 |
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