https://scholars.lib.ntu.edu.tw/handle/123456789/500877
Title: | Defect-Tolerant Hierarchical Sorting Networks for Wafer-Scale Integration | Authors: | SY-YEN KUO | Issue Date: | 1991 | Journal Volume: | 26 | Journal Issue: | 9 | Start page/Pages: | 1212-1222 | Source: | IEEE Journal of Solid-State Circuits | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/500877 | DOI: | 10.1109/4.84937 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.