https://scholars.lib.ntu.edu.tw/handle/123456789/500903
Title: | IC HTOL Test Stress Condition Optimization. | Authors: | Peng, Brian Chen, Ing-Yi Kuo, Sy-Yen Bolger, Colin SY-YEN KUO |
Issue Date: | 2004 | Start page/Pages: | 272-279 | Source: | 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/500903 | DOI: | 10.1109/DFT.2004.33 |
Appears in Collections: | 電機工程學系 |
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