https://scholars.lib.ntu.edu.tw/handle/123456789/501519
Title: | Structural evolution of in situ boron-doped SiGe ultrathin film analyzed by multi-optical methods | Authors: | Chang, F.-M. Wu, Z.-Z. Chen, Y. Yen, T.-Y. Huang, Y.-H. Chong, L.-Y. Jangjian, S.-K. Lee, F.-Y. Chang, Y.-M. Lo, K.-Y. |
Issue Date: | 2020 | Publisher: | Institute of Physics Publishing | Journal Volume: | 31 | Journal Issue: | 27 | Start page/Pages: | 1-11 | Source: | Nanotechnology | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/501519 | ISSN: | 09574484 | DOI: | 10.1088/1361-6528/ab8422 |
Appears in Collections: | 凝態科學研究中心 |
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