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  1. NTU Scholars
  2. 電機資訊學院
  3. 電機工程學系
Please use this identifier to cite or link to this item: https://scholars.lib.ntu.edu.tw/handle/123456789/516591
DC FieldValueLanguage
dc.contributor.authorY.-N. Chenen-US
dc.contributor.authorC.-J. Chenen-US
dc.contributor.authorM.-L. Fanen-US
dc.contributor.authorV. P.-H. Huen-US
dc.contributor.authorPin Suen-US
dc.contributor.authorC.-T. Chuangen-US
dc.contributor.authorVITA PI-HO HUen-US
dc.contributor.authorY.-N. Chenzh-TW
dc.contributor.authorC.-J. Chenzh-TW
dc.contributor.authorM.-L. Fanzh-TW
dc.contributor.authorV. P.-H. Huzh-TW
dc.contributor.authorPin Suzh-TW
dc.contributor.authorC.-T. Chuangzh-TW
dc.contributor.author胡璧合zh-TW
dc.contributor.authorVITA PI-HO HUzz
dc.creatorY.-N. Chen;C.-J. Chen;M.-L. Fan;V. P.-H. Hu;Pin Su;C.-T. Chuang-
dc.date.accessioned2020-10-07T01:23:14Z-
dc.date.available2020-10-07T01:23:14Z-
dc.date.issued2015-
dc.identifier.urihttps://scholars.lib.ntu.edu.tw/handle/123456789/516591-
dc.relation.ispartofJournal of Low Power Electronics and Applications-
dc.titleImpacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuitsen_US
dc.typejournal article-
dc.identifier.doi10.3390/jlpea5020101-
dc.identifier.scopus2-s2.0-84930937802-
dc.relation.pages101-115-
dc.relation.journalvolume5-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypejournal article-
crisitem.author.deptElectrical Engineering-
crisitem.author.deptElectrical Engineering-
crisitem.author.deptElectrical Engineering-
crisitem.author.orcid0000-0002-6216-214X-
crisitem.author.orcid0000-0002-6216-214X-
crisitem.author.orcid0000-0002-6216-214X-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:電機工程學系
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臺大位居世界頂尖大學之列，為永久珍藏及向國際展現本校豐碩的研究成果及學術能量，圖書館整合機構典藏（NTUR）與學術庫（AH）不同功能平台，成為臺大學術典藏NTU scholars。期能整合研究能量、促進交流合作、保存學術產出、推廣研究成果。

To permanently archive and promote researcher profiles and scholarly works, Library integrates the services of “NTU Repository” with “Academic Hub” to form NTU Scholars.

總館學科館員 (Main Library)
醫學圖書館學科館員 (Medical Library)
社會科學院辜振甫紀念圖書館學科館員 (Social Sciences Library)

開放取用是從使用者角度提升資訊取用性的社會運動，應用在學術研究上是透過將研究著作公開供使用者自由取閱，以促進學術傳播及因應期刊訂購費用逐年攀升。同時可加速研究發展、提升研究影響力，NTU Scholars即為本校的開放取用典藏（OA Archive）平台。（點選深入了解OA）

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  • 網站簡介 (Quickstart Guide)
  • 使用手冊 (Instruction Manual)
  • 線上預約服務 (Booking Service)
  • 方案一：臺灣大學計算機中心帳號登入
    (With C&INC Email Account)
  • 方案二：ORCID帳號登入 (With ORCID)
  • 方案一：定期更新ORCID者，以ID匯入 (Search for identifier (ORCID))
  • 方案二：自行建檔 (Default mode Submission)
  • 方案三：學科館員協助匯入 (Email worklist to subject librarians)
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