https://scholars.lib.ntu.edu.tw/handle/123456789/516602
Title: | Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications | Authors: | M.-L. Fan Y.-N. Chen P. Su C.-T. Chuang VITA PI-HO HU |
Keywords: | Fin-shaped field-effect transistor (FinFET); sense amplifier (SA); subthreshold circuit; variability | Issue Date: | 2012 | Journal Volume: | 59 | Journal Issue: | 12 | Start page/Pages: | 878-882 | Source: | IEEE Transactions on Circuits and Systems II: Express Briefs | Abstract: | This paper investigates the impact of intrinsic random variability on the robustness of sense amplifier (SA) for fin-shaped field-effect transistor (FinFET) subthreshold static random access memory (SRAM) applications. We employ a model-assisted statistical approach to consider both fin line edge roughness (fin LER) and work function variation, which are regarded as the major variation sources in an advanced FinFET device. Our results indicate that fin LER dominates the overall variability of subthreshold SA robustness and sensing margin. In addition, it is observed that the offset voltage (OS) of current latch SA calculated solely from threshold voltage (T) mismatch underestimates the actual variation and is shown to be optimistic. For large-signal single-ended inverter sensing, we find that sense '0' hinders the allowable sensing margin and needs to be carefully designed. Compared with bulk CMOS, the superior electrostatic integrity and variability of FinFET enhance the feasibility of differential sensing in subthreshold SRAM applications. © 2004-2012 IEEE. |
URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516602 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84873405974&doi=10.1109%2fTCSII.2012.2231016&partnerID=40&md5=f82f98b0b9afbdae73104a1cd48468f8 |
ISSN: | 15497747 | DOI: | 10.1109/tcsii.2012.2231016 | SDG/Keyword: | Electric current regulators; Fins (heat exchange); Roughness measurement; Static random access storage; Threshold voltage; Electrostatic integrity; Fin-shaped field-effect transistor (FinFET); Sense amplifier; Static random access memory; Statistical approach; Sub-threshold circuits; variability; Variability analysis; FinFET |
Appears in Collections: | 電機工程學系 |
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