https://scholars.lib.ntu.edu.tw/handle/123456789/559026
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Yang, C.-F. | en_US |
dc.contributor.author | Chen, B.-J. | en_US |
dc.contributor.author | Chen, W.-C. | en_US |
dc.contributor.author | Lin, K.-W. | en_US |
dc.contributor.author | Hwu, J.-G. | en_US |
dc.contributor.author | JENN-GWO HWU | zz |
dc.date.accessioned | 2021-05-05T02:52:25Z | - |
dc.date.available | 2021-05-05T02:52:25Z | - |
dc.date.issued | 2019 | - |
dc.identifier.uri | https://www.scopus.com/inward/record.url?eid=2-s2.0-85057188985&partnerID=40&md5=69a3bc575b25bab107f52d3af9890a88 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/559026 | - |
dc.relation.ispartof | IEEE Transactions on Electron Devices | - |
dc.title | Gate Oxide Local Thinning Mechanism-Induced Sub-60 mV/Decade Subthreshold Swing on Charge-Coupled MIS(p) Tunnel Transistor | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.1109/TED.2018.2879654 | - |
dc.identifier.scopus | 2-s2.0-85057188985 | - |
dc.relation.pages | 279-285 | - |
dc.relation.journalvolume | 66 | - |
dc.relation.journalissue | 1 | - |
item.fulltext | no fulltext | - |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 電機工程學系 |
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