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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Edge-Etched Al<inf>2</inf>O<inf>3</inf>Dielectric as Charge Storage Region in a Coupled MIS Tunnel Diode Sensor
Details
Edge-Etched Al2O3Dielectric as Charge Storage Region in a Coupled MIS Tunnel Diode Sensor
Journal
IEEE Journal of the Electron Devices Society
Journal Volume
8
Pages
825-833
Date Issued
2020
Author(s)
Chen, B.-J.
JENN-GWO HWU
DOI
10.1109/JEDS.2020.3011996
URI
https://www.scopus.com/inward/record.url?eid=2-s2.0-85089936480&partnerID=40&md5=eecf2999c3d39e9e4948b36fa0513627
https://scholars.lib.ntu.edu.tw/handle/123456789/559029
Type
journal article
