https://scholars.lib.ntu.edu.tw/handle/123456789/559029| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chen, B.-J. | en_US |
| dc.contributor.author | Hwu, J.-G. | en_US |
| dc.contributor.author | JENN-GWO HWU | zz |
| dc.date.accessioned | 2021-05-05T02:52:26Z | - |
| dc.date.available | 2021-05-05T02:52:26Z | - |
| dc.date.issued | 2020 | - |
| dc.identifier.uri | https://www.scopus.com/inward/record.url?eid=2-s2.0-85089936480&partnerID=40&md5=eecf2999c3d39e9e4948b36fa0513627 | - |
| dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/559029 | - |
| dc.relation.ispartof | IEEE Journal of the Electron Devices Society | - |
| dc.title | Edge-Etched Al<inf>2</inf>O<inf>3</inf>Dielectric as Charge Storage Region in a Coupled MIS Tunnel Diode Sensor | en_US |
| dc.type | journal article | - |
| dc.identifier.doi | 10.1109/JEDS.2020.3011996 | - |
| dc.identifier.scopus | 2-s2.0-85089936480 | - |
| dc.identifier.isi | WOS:000559512700012 | - |
| dc.relation.pages | 825-833 | - |
| dc.relation.journalvolume | 8 | - |
| item.grantfulltext | none | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.openairetype | journal article | - |
| item.fulltext | no fulltext | - |
| item.cerifentitytype | Publications | - |
| crisitem.author.dept | Electrical Engineering | - |
| crisitem.author.dept | Electronics Engineering | - |
| crisitem.author.orcid | 0000-0001-9688-0812 | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 電機工程學系 | |
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