https://scholars.lib.ntu.edu.tw/handle/123456789/612015
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jywe W. | en_US |
dc.contributor.author | Lin C.-C. | en_US |
dc.contributor.author | Shyu L.-H. | en_US |
dc.contributor.author | Lin B.-J. | en_US |
dc.contributor.author | Wen-Yuh Jywe | en_US |
dc.creator | Jywe W.;Lin C.-C.;Shyu L.-H.;Lin B.-J. | - |
dc.date.accessioned | 2022-05-24T06:26:59Z | - |
dc.date.available | 2022-05-24T06:26:59Z | - |
dc.date.issued | 2002 | - |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036544326&partnerID=40&md5=e558a306a1645bb45195818874f205bd | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/612015 | - |
dc.description.abstract | Various testing devices for specified contouring testing purposes on a CNC machine tool were developed in this paper. For checking the dynamic performance of a CNC machine tool, a small-radius contouring device was employed. This device was composed of a laser diode and a quadrant sensor. For checking geometry error of a CNC machine tool, a long-radius contouring device was employed. An optical scale contouring system with designed linkage was developed Furthermore, the application of this optical scale linkage to test the volumetric error of a CNC machine tool was represented. Also, a 2D optical encoder contouring system was introduced to test the performance of a CNC machine tool under various NC paths. Finally, for checking the contouring performance of a CNC machine tool under actual cutting conditions, a non-contact in-processing measurement device was described. Experimental work was carried out and represented in the paper. | - |
dc.relation.ispartof | Journal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao | - |
dc.subject | Least squares approximations | - |
dc.subject | Machine tools | - |
dc.subject | Optical sensors | - |
dc.subject | Quality control | - |
dc.subject | Semiconductor lasers | - |
dc.subject | Quadrant sensor contouring system (QSCS) | - |
dc.subject | Contour measurement | - |
dc.title | The development of contouring testing devices for CNC machine tools | en_US |
dc.type | journal article | en |
dc.identifier.scopus | 2-s2.0-0036544326 | - |
dc.relation.pages | 143-153 | - |
dc.relation.journalvolume | 23 | - |
dc.relation.journalissue | 2 | - |
item.fulltext | no fulltext | - |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
item.openairetype | journal article | - |
crisitem.author.dept | Mechanical Engineering | - |
crisitem.author.parentorg | College of Engineering | - |
Appears in Collections: | 機械工程學系 |
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