尖端掃描探針顯微技術檢測前瞻半導體材料元件關鍵特性-原子級掃描探針顯微技術檢測半導體關鍵材料元件表面介面能譜分析(1/3)

Project title

尖端掃描探針顯微技術檢測前瞻半導體材料元件關鍵特性-原子級掃描探針顯微技術檢測半導體關鍵材料元件表面介面能譜分析(1/3)

Internal ID

112-2119-M-002-021-MBK

Principal Investigator

Start Date

May 1, 2023

End Date

April 30, 2024

Organizations

Applied Physics

Partner Organizations

National Science and Technology Council