https://scholars.lib.ntu.edu.tw/handle/123456789/69715| Title: | An Innovative Micro/nano Probe Measurement System for 3D Profile of Microstructure | Authors: | Chen, Y. J. Fan, K. C. Liu, Y. S. |
Issue Date: | May-2006 | Journal Volume: | 27 | Journal Issue: | 1 | Start page/Pages: | 12-17 | Source: | China ACTA METROLOGICA SINICA(J) | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/200113 |
| Appears in Collections: | 機械工程學系 |
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