https://scholars.lib.ntu.edu.tw/handle/123456789/74243
Title: | Formation of mullite thin film via a sol-gel process with polyvinylpyrrolidone additive | Authors: | Chen, Yen-Yu Wei, Wen-Cheng J. |
Keywords: | Mullite; PVP; Sol-gel processes; Spin coating; Thin films | Issue Date: | 2001 | Journal Volume: | 21 | Journal Issue: | 14 | Start page/Pages: | 2535-2540 | Source: | Journal of the European Ceramic Society | Abstract: | Several tasks were tried to prepare crack-free mullite films on silica substrates. Basically, a sol containing TEOS (Tetraethylorthosilicate) and boehmite colloid was used for spin coating on silica substrate. The formulation of the sols was kept in stoichiometric composition 3Al 2O 3·2SiO 2, or contained a crack-limiting agent, Polyvinylpyrrolidone (PVP). These films were then treated up to 1300°C. The properties of the sols and the dried films were characterized by rheometer, various thermal analysis techniques (DTA, TGA and TMA), also by XRD, SEM and TEM. The mullite film shows randomly oriented grains in sizes from 0.1 μm to a few micrometers. The films still contain fine θ- and δ-Al 2O 3 particles after being treated at 1280°C for 1 h. © 2001 Elsevier Science Ltd. All rights reserved. |
URI: | http://ntur.lib.ntu.edu.tw//handle/246246/95358 https://www.scopus.com/inward/record.uri?eid=2-s2.0-0034834059&doi=10.1016%2fS0955-2219%2801%2900277-1&partnerID=40&md5=584aea2a7ff3cc2ab29da18415cf7710 |
ISSN: | 09552219 | SDG/Keyword: | Spin coatings; Coatings; Grain size and shape; Rheometers; Scanning electron microscopy; Silica; Sol-gels; Stoichiometry; Transmission electron microscopy; X ray diffraction analysis; Thin films; additive; ceramics; film; mullite |
Appears in Collections: | 材料科學與工程學系 |
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