A Test-Application-Count Based Learning Technique for Test Time Reduction

G.-Y. LinK.-H. TsaiJ.-L. HuangW.-T. ChengJIUN-LANG HUANG2018-09-102018-09-102015-01http://scholars.lib.ntu.edu.tw/handle/123456789/394735A Test-Application-Count Based Learning Technique for Test Time Reductionconference paper10.1109/VLSI-DAT.2015.71145072-s2.0-84936980470