Effects of gate-bias stress on ZnO thin-film transistors

L.-Y. SuH.-Y. LinS.-L. WangY.-H. YehC.-C. ChengL.-H. PengJ.-J. HuangJIAN-JANG HUANGLUNG-HAN PENG2018-09-102018-09-102010-01http://scholars.lib.ntu.edu.tw/handle/123456789/359466Effects of gate-bias stress on ZnO thin-film transistorsjournal article10.1889/JSID18.10.8022-s2.0-77958193683WOS:000283668800013